SmartPro Quiz-S Precious Metal Analyzer

Deliver non-destructive precious metal assays, identify gold karat values with laboratory accuracy, and detect gold-plating fraud in 10 to 60 seconds. Designed specifically for retail jewelry showrooms, pawn brokers, bullion traders, refiners, and assay laboratories, the SmartPro Quiz-S Precious Metal Analyzer is a compact benchtop Energy Dispersive X-Ray Fluorescence (ED-XRF) spectrometer combining micro-focus precision with a user-friendly standalone touchscreen interface.

Powered by proprietary SmartPro QUIZ XRF processing algorithms and a high-stability 40 kV micro-focus X-ray source manufactured in the USA, the Quiz-S determines exact elemental compositions with typical precious metal accuracy below 0.10% and gold repeatability at $\pm 0.03\%$ (Gold 585°). An integrated HD live-view targeting camera and an interior LED light project a fixed 1 mm collimated analysis spot directly onto small prongs, filigree wires, solder joints, or bullion bars. Available with a standard High-Resolution Silicon Drift Detector (SDD) (detecting 81 elements from Magnesium $^{12}\text{Mg}$ to Uranium $^{92}\text{U}$) or an optional Silicon PIN Diode Detector (Si-PIN) (detecting 71 elements from Titanium $^{22}\text{Ti}$ to Uranium $^{92}\text{U}$), the Quiz-S provides comprehensive testing capabilities for all professional assay environments.

Key Highlights & Advanced Technology

• Fast Assay Testing (10–60 Seconds): Instantaneous elemental breakdown and gold karat verification displayed in seconds, streamlining buying transactions and scrap appraisal counters.

• USA-Made 40 kV Micro-Focus X-Ray Tube: High-voltage excitation source produces steady, repeatable spectral counts across light, transitional, and heavy precious elements.

• Two High-Performance Detector Configurations:

  • SDD Detector (Standard): High-resolution 135–145 eV resolution at Mn Kα with a large 25 mm² active area. Detects 81 elements (12Mg to 92U), capturing light alloy elements (such as aluminum and silicon) and low-ppm trace contaminants.

  • Si-PIN Detector (Optional): Reliable 6 mm² active area diode detector. Detects 71 elements (22Ti to 92U) for standard gold, silver, platinum, and palladium karat verification.

• Dynamic Gold Plating Detection Filter: Algorithms analyze spectral ratios between base metals and surface layers, alerting the operator to gold plating, heavy electroplating, and rolled-gold coatings.

• Integrated HD Targeting Camera: Live video feed on the 5-inch color display shows the exact 1 mm analysis crosshair spot for targeting tiny jewelry mountings.

• Fully Shielded & Interlocked Radiation Safety: Certified radiation leakage below $1\ \mu\text{Sv/h}$. The automatic hardware lid interlock cuts X-ray generation instantly if the chamber is opened during testing.

• Transparent Lead-Shielded Safety Lid: Customers can observe their jewelry throughout the non-destructive testing cycle, reinforcing trust at the retail counter.

• Standalone Operation with Full I/O: Runs on an embedded Windows CE system requiring no external computer, with USB, MicroSD, Ethernet LAN, and Wi-Fi data export options.

Technical Specifications & Product Matrix

Parameter Metric	Certified Factory Specification
Brand Authority	SmartPro Instruments
Instrument Model	Quiz-S (Precious Metal & Gold Analyzer)
Operating Principle	Energy Dispersive X-Ray Fluorescence (ED-XRF)
X-Ray Source	40 kV High-Stability Micro-Focus Tube (Made in USA)
Detector Option 1 (Standard)	High-Resolution SDD (135–145 eV at Mn Kα, 25 mm² active area)
Detector Option 2 (Optional)	Si-PIN Diode Detector (6 mm² active area)
Element Range (SDD)	81 Elements: Magnesium (12Mg) to Uranium (92U)
Element Range (Si-PIN)	71 Elements: Titanium (22Ti) to Uranium (92U)
Collimation Analysis Spot	Fixed 1.0 mm Precision Collimated Spot
Typical Assay Accuracy	< 0.10% for Precious Metals & Jewelry (Method/Time Dependent)
Gold Repeatability	± 0.03% (Typical on Gold 585° / 14K)
Testing Cycle Time	10 to 60 Seconds (Selectable Assay Modes)
Optical Targeting	HD Live-View Camera with Integrated LED Illumination
User Interface	5-inch High-Resolution Color Touchscreen Display
Embedded Operating System	Windows CE (Integrated Standalone Firmware)
Optional External PC OS	Windows XP / Vista / 7 / 8 Compatibility
Radiation Safety Shielding	Certified < 1 µSv/h; Hardware Auto-Shutdown Lid Interlock
Viewing Chamber Lid	Transparent Lead-Shielded Acrylic Inspection Window
Connectivity & Data I/O	USB 2.0, MicroSD Card Slot, Ethernet (LAN), Wi-Fi
Power Supply Input	AC 100–240 V, 50/60 Hz (Universal External Adapter)
External Unit Dimensions	210 mm (W) x 272 mm (L) x 198 mm (H)
Chamber Dimensions	160 mm (W) x 174 mm (L) x 74 mm (H)
Instrument Net Weight	5.5 kg (12.1 lbs)

Detector Comparison: Si-PIN vs. SDD

Feature Metric	Si-PIN Detector Configuration	SDD (Silicon Drift) Detector Configuration
Sensor Active Area	6 mm² Active Diode Area	25 mm² Active Drift Area
Spectral Resolution	Standard Resolution (approx. 165–180 eV)	High Resolution (135–145 eV at Mn Kα)
Detectable Elements	71 Elements: Titanium (22Ti) to Uranium (92U)	81 Elements: Magnesium (12Mg) to Uranium (92U)
Light Element Detection	Limited (Does not capture light alloys below Ti)	Broad (Detects light elements Mg, Al, Si, P, S)
Count Rate & Speed	Standard counting speed (30–60s typical)	High count rate throughput (10–30s fast scans)
Best Application Fit	Retail gold buying, standard pawn karat sorting	High-volume refining, lab assays, trace alloy analysis